Particle alignment reliability in single particle electron cryomicroscopy: a general approach
نویسندگان
چکیده
منابع مشابه
Particle alignment reliability in single particle electron cryomicroscopy: a general approach
Electron Microscopy is reaching new capabilities thanks to the combined effect of new technologies and new image processing methods. However, the reconstruction process is still complex, requiring many steps and elaborated optimization procedures. Therefore, the possibility to reach a wrong structure exists, justifying the need of robust statistical tests. In this work, we present a conceptuall...
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2016
ISSN: 2045-2322
DOI: 10.1038/srep21626